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The Application of Optical Metrology in Support of the Space Shuttle Program

Capture 3D Scanners

This presentation by NASA was a keynote given at the GOM International Conference and the Capture 3D Innovation Users Conference in 2012 that covers 30 years of flight history using GOM optical metrology technology for 3D scanning, inspection, photogrammetry, deformation, strain and material testing.

This presentation was given at the Capture 3D Users Conference in 2012. To receive a copy of the entire presentation, please fill out the form below or email .  

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